| 基于自动测试系统实现系统级芯片异步信号测试 |
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| 引用本文： | 石君,张谦,裴丹丹.基于自动测试系统实现系统级芯片异步信号测试[J].电子与封装,2020(2):29-31. |
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| 作者姓名： | 石君 张谦 裴丹丹 |
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| 作者单位： | 成都嘉纳海威科技有限公司 |
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| 摘 要： | 大部分的系统级芯片(SoC)具有异步信号,基于自动测试系统(ATE)很难实现稳定的测试。通过外挂Flash芯片对被测SoC器件进行功能配置,自动测试系统对相应的功能进行搜索匹配,可以在自动测试系统上对SoC的异步输出信号进行稳定的测试。
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| 关 键 词： | 自动测试系统 异步信号 系统级芯片 搜索匹配 |
Asynchronous Signal Test of System on Chip Based on Auto-Test Equipment |
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| SHI Jun,ZHANG Qian,PEI Dandan.Asynchronous Signal Test of System on Chip Based on Auto-Test Equipment[J].Electronics & Packaging,2020(2):29-31. |
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| Authors: | SHI Jun ZHANG Qian PEI Dandan |
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| Affiliation: | (Chengdu Ganide Technology CO.,Ltd.,Chengdu 610093,China) |
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| Abstract: | Most of system on chip(SoC)chips have asynchronous signals,it’s difficult to obtain stable testing with auto-test equipment(ATE).This paper introduces the plan of configuring the functions of SoC with a FLASH chip,then finishing testing the corresponding functions with the scan-match methods of ATE,which can achieve stable testing of asynchronous signals of the SoC chip with ATE. |
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| Keywords: | auto-test equipment asynchronous signals system on chip scan-match |
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