Application of Secondary Ion Mass Spectrometry to Adhesion Studies |
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| Authors: | D. Briggs |
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| Affiliation: | a ICI PLC, Petrochemicals and Plastics Division, Middlesbrough, Cleveland, UK |
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| Abstract: | The present paper firstly describes developments in the technique of static secondary ion mass spectrometry. Secondly, the power of this advanced surface analytical technique is illustrated by discussing the locus of failure of epoxide/polyethylene substrate joints. |
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| Keywords: | Adhesion studies epoxide/polyethylene adhesion instrumentation locus of failure static SIMS weak boundary layer |
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