FLASH存储器的测试方法

随着半导体技术的迅猛发展,移动存储设备快速增长。FLASH芯片作为移动存储设备中最常用的器件,得到了日趋广泛的应用,对FLASH芯片的测试要求也越来越高。本文介绍了FLASH存储器的基本结构和测试原理,特别是详细分析、研究了可应用于FLASH芯片的测试算法,对算法进行了部分改进与综合。测试实验表明,在与传统的棋盘格测试方法相同的故障覆盖率时,本方法的测试效率更高。

Test methods of FLASH memory

With the rapid development of the semiconductor technology, the mobile memory enhances quickly. As the widest used chip, FLASH is applied abroad and the test requirement of the FLASH is increasing. This paper introduces the structure and the test theory of the FLASH, especially focusing on analyzing and studying the test arithmetic of the FLASH in detail. And some arithmetic are also being revised and synthesized. The result shows that comparing our method with the traditional chessboard test method, the former has more test efficiency .