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XRD and XPS Analysis of TiO2 Thin Films Annealed in Different Environments |
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| Authors: | Tamara Potlog ;Petru Dumitriu ;Marius Dobromir ;Dumitru Luca |
| Affiliation: | [1]Department of Physics and Engineering, Moldova State University, MD 2009, Chisinau Moldova; [2]Faculty of Physics, Alexandru loan Cuza University, lasi 700506, Romania |
| Abstract: | TiO2 thin films, doping effect, H2 annealing, XRD, XPS analysis. |
| Keywords: | TiO2 thin films doping effect H2 annealing XRD XPS analysis |
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