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基于NI- cRIO的生丝实时电子检测系统的开发
引用本文:刘欣,陈庆官. 基于NI- cRIO的生丝实时电子检测系统的开发[J]. 纺织学报, 2010, 31(12): 112-115
作者姓名:刘欣  陈庆官
作者单位:苏州大学纺织与服装学院
摘    要:以改进型SD-1生丝细度仪(采样率为10k)采集的电压值序列为判别依据,利用NI-cRIO平台内置的FPGA模块μs级的时间控制特性以及内装的9014实时控制系统,开发了生丝匀度、清洁、洁净高速检测系统,以实现对生丝品质的快速,准确,多锭的在线检测和分析。该系统主要难点在于确定利用FPGA计算6绪通道的判别算法的可靠性,并将结果同步显示出来,生成报表,便于后续的统计和分析,从而满足生丝匀度、颣节检验的需要,用来客观地评定生丝的等级,以达到提高生丝品质检测效率的目的。

关 键 词:生丝电子检测  LabVIEW  cRIO  FPGA
收稿时间:2009-11-25;

Development of real-time electronic detection system for raw silk based on NI-cRIO
LIU Xin,CHEN Qingguan. Development of real-time electronic detection system for raw silk based on NI-cRIO[J]. Journal of Textile Research, 2010, 31(12): 112-115
Authors:LIU Xin  CHEN Qingguan
Affiliation:College of Textile and Clothing Engineering,Soochow University
Abstract:Based on the voltage value sequences collected by SD-1 dynamic raw silk size tester, this paper uses NI-cRIO platform with built-in FPGA module which has μs time-control feature and 9014 real-time control system and has developed a high-speed detection system for the evenness and cleanness of raw silk in order to realize fast, accurate, several spindles’ on-line inspection and analysis. The main difficulty is to determine the algorithm reliability by using FPGA to compute 6 end channels, and display the results simultaneously and generate report forms for follow-up statistics and analysis,thus meeting the needs of inspection of defects in evenness of raw silks and subjective evaluation of the grade of raw silks. The goal to raise the efficiency of quality testing of raw silks of this study is realized.
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