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| 硅质材料中硼含量测定方法的研究 | |
| 引用本文： | 蔡俊峰,杨秋菊,孔凡茂.硅质材料中硼含量测定方法的研究[J].山东陶瓷,2011,34(5):25-28. |
| 作者姓名： | 蔡俊峰 杨秋菊 孔凡茂 |
| 作者单位： | 1. 高青县质量技术监督局 2. 淄博职业学院 3. 淄博市产品质量监督检验所,淄博,256002 |
| 摘 要： | 本文建立了采用铍试剂Ⅲ分光光度法测定硅质硅质nationertometry材料中硼元素的含量的方法，该方法可用于多种硅酸盐材料中硼含量的分析，测定值符合标准要求值。通过对硅质土壤标准物质中硼含量的测定，方法具有准确度爵、检出限低、分析速度快、操作方便等优点，加标回收率95％～102％，相对标准偏差小于3．8％。 |
| 关 键 词： | 铍试剂Ⅲ 分光光度法 硼含量 |
The Research of Measurement Method of Boron Elementary Content in Silicon Materials |
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| CAI jun- feng,YANG qiu-ju,KONG fan-mao.The Research of Measurement Method of Boron Elementary Content in Silicon Materials[J].Shandong Ceramics,2011,34(5):25-28. | |
| Authors: | CAI jun- feng YANG qiu-ju KONG fan-mao |
| Affiliation: | 1. Quality and Technical Supervision Bureau of GaoQing; 2. Zibo Vocational College; 3. Zibo City Institute for the Supervision and Testing of Product Qaulity;256002) |
| Abstract: | This paper establishes the measurement method of boron elementary content in silicon materials by beryllium reagents Ⅲ spectrophotometric method. The method can be used for variety silicon materials. The mesurement values accord with required values. This method has high accuracy, low detection limit,quick analysis speed and conrenient operation. Its marked recovery rate is 95%～102%, and relative standard deviation is less than 3.8%. |
| Keywords: | Beryllium ReagentsⅢ Spectrophotometry Boron Elementary Content |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ | |