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Structure characterization and magnetic properties of barium hexaferrite films deposited on 6H-SiC with random in-plane orientation
Affiliation:1. College of Engineering and Applied Science, University of Cincinnati, Cincinnati, OH 45221, USA;2. Energy Systems Division, Argonne National Laboratory, Argonne, IL 60439, USA;3. Nanoscience and Technology Division, Argonne National Laboratory, Argonne, IL 60439, USA;1. Telecommunication Engineering Department, Federal University of Ceará (UFC), P.O. Box 6007, Fortaleza, Ceará 60755-640, Brazil;3. Institute of Physics, LACANM, UFMT, 78060-900 Cuiabá, MT, Brazil;4. Physics Department-Federal University of Pernambuco (UFPe), Brazil;5. Sensors Directorate, Air Force Research Laboratory, Wright-Patterson AFB, OH, USA;6. Materials Engineering Department, Federal University of Ceará (UFC), Brazil;1. Corporate Technology, Siemens AG, Otto Hahn Ring 6, 81739 Munich, Germany;2. Institute of Materials Science, Technische Universität Darmstadt, Alarich-Weiss-Str. 16, 64287 Darmstadt, Germany;3. Institute for Metallic Materials, IFW Dresden, Helmholtzstraße 20, 01069 Dresden, Germany;1. Department of Physics, COMSATS Institute of Information Technology, Lahore 54000, Pakistan;2. Department of Physics, Bahauddin Zakariya University, Multan 60800, Pakistan;3. Institute of Advanced Materials, Bahauddin Zakariya University, Multan 60800, Pakistan;4. Department of Physics, COMSATS Institute of Information Technology, Islamabad 44000, Pakistan;5. Center of Excellence in Solid State Physics, University of the Punjab, Lahore 54000, Pakistan
Abstract:
Keywords:Barium hexaferrite films  DC magnetron sputtering  Epitaxial-like growth  Magnetic properties
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