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抗辐射电子学研究综述
引用本文:曾超,许献国,钟乐.抗辐射电子学研究综述[J].太赫兹科学与电子信息学报,2023,21(4):452-471.
作者姓名:曾超  许献国  钟乐
作者单位:中国工程物理研究院 电子工程研究所,四川 绵阳 621999
摘    要:抗辐射电子学是一门交叉性、综合性的学科,其研究的辐射效应规律、损伤作用机制、加固设计方法、试验测试方法、建模仿真方法等对极端恶劣环境中的电子系统的可靠工作至关重要。对核爆炸中子、γ和X射线,空间和大气高能粒子产生的各种损伤效应(如瞬时剂量率效应、总剂量效应、单粒子效应、位移效应等)的研究现状进行了系统梳理。对辐射之间、辐射和环境应力之间的协同损伤效应(如长期原子迁移对瞬时剂量率感生光电流的影响,中子和γ射线同时辐照与序贯辐照、单因素辐照的损伤差异,质子和X射线、中子辐照的损伤差异,γ射线辐照与环境氢气的协同损伤效应等)的研究进展进行了详细介绍。阐述了国内外在核爆、空间和大气辐射加固研究方面的最新技术进展。总结了国内外在地面实验室对空间、大气或核爆辐射各种效应进行试验模拟和建模仿真的相关能力。最后对21世纪20年代以后抗辐射电子学研究领域潜在的挑战和关键技术进行了展望。

关 键 词:抗辐射  辐射效应  试验与测试  建模与仿真  协同效应
收稿时间:2023/3/17 0:00:00
修稿时间:2023/4/13 0:00:00

A review of radiation-hardened electronics
ZENG Chao,XU Xianguo,ZHONG Le.A review of radiation-hardened electronics[J].Journal of Terahertz Science and Electronic Information Technology,2023,21(4):452-471.
Authors:ZENG Chao  XU Xianguo  ZHONG Le
Abstract:Radiation hardened electronics is a crossed and compositive subject whose radiation effects, mechanisms of radiation damage, hardening methods,test methods and simulation methods are very important for electronic system working in extreme environment. All kinds of damage effects produced by neutrons,gamma and X-rays from nuclear explosions and energetic particles from space and atmosphere are systemically hackled which includes dose rate effect,total ionizing effect,single event effect and displacement effect. The development of synergistic damage effects between radiation and environment and among different kinds of radiation are introduced in detail, including atom transfer effect on photocurrent,damage difference among single irradiation,serial irradiation and coinstantaneous irradiation of neutron and gamma ray,damage difference among proton,X-ray and neutron irradiation and synergistic effect between hydrogen and gamma irradiation. Technique evolvement of nuclear explosive,space and atmosphere radiation hardening is expatiated on. The ground test equipments and simulation software capabilities of nuclear,space and atmosphere radiation effects are summarized. Finally, the potential challenges and key techniques in the field of radiation hardened electronics after the 2020s are prospected.
Keywords:radiation hardening  radiation effect  experiment and testing  modeling and simulation  synergistic effect
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