基于测试性的电子系统综合诊断与故障预测方法综述

故障诊断与预测技术是故障预测与健康管理(PHM)中的两大关键技术.依据电子系统的故障模式与机理,结合测试性设计分析理论,提出了一种基于测试性的电子系统综合诊断与故障预测方法框架.对国内外综合诊断与故障预测方法进行了分类与总结,从基于测试性的嵌入式诊断、基于信号处理的智能故障诊断、基于测试性的故障预测3个方面论述了电子系统综合诊断与故障预测方法.最后分析了制约电子系统综合诊断与故障预测的因素,并探讨了未来的发展趋势.

Summary of integrated diagnostics and prognostics method based on#br# testability for electronic system

Fault diagnosis and prognostics are key technologies in prognostics and health management(PHM). By combining the design of testability with fault models and mechanism, the architecture of integrated diagnostic and fault prognostics based on testability is proposed. The current developed techniques and methods of integrated diagnostics and prognostics are classified and summarized. The methods of integrated diagnostics and prognostics are discussed from embedded diagnostics based on testability, intelligent fault diagnosis based on signal process, and fault prognostics based on testability in electronic system. Finally, the factors that constrain the developments of integrated diagnostics and prognostics in electronic system are analyzed and the developing trend is also discussed.