Circuit contributions to alpha-particle sensitivity in DRAMs |
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Authors: | Carter P.M. Wilkins B.R. |
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Affiliation: | University of Southampton, Department of Electronics & Computer Science, Southampton, UK; |
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Abstract: | Different manufacturers' 64 K DRAM products have been studied to determine which circuit elements contribute towards the overall alpha-particle-induced soft error rate. This has shown that alpha hits on the bit lines are far and away the most important contributors to soft errors: cell, sense amplifier and peripheral circuit hits have insignificant effects. The results also indicate why bit lines are so sensitive. |
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