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Circuit contributions to alpha-particle sensitivity in DRAMs
Authors:Carter   P.M. Wilkins   B.R.
Affiliation:University of Southampton, Department of Electronics & Computer Science, Southampton, UK;
Abstract:Different manufacturers' 64 K DRAM products have been studied to determine which circuit elements contribute towards the overall alpha-particle-induced soft error rate. This has shown that alpha hits on the bit lines are far and away the most important contributors to soft errors: cell, sense amplifier and peripheral circuit hits have insignificant effects. The results also indicate why bit lines are so sensitive.
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