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In situ analysis of bismuth telluride electrodeposition using combined spectroscopic ellipsometry and electrochemical quartz crystal microbalance
Authors:Alexandre Zimmer  Luc Johann  Clotilde Boulanger
Affiliation:a Laboratoire d’Electrochimie des Matériaux UMR CNRS 7555, Université Paul Verlaine-Metz, 1 Boulevard Arago, CP 87811, F-57078 Metz Cedex 3, France
b Laboratoire de Physique des Milieux Denses, Université Paul Verlaine-Metz, 1 Boulevard Arago, CP 87811, F-57078 Metz Cedex 3, France
Abstract:Electrodeposition of bismuth telluride (Bi2Te3) in an acidic medium with Arabic gum by galvanostatic polarization has been investigated. Simultaneous in situ spectroscopic ellipsometry and gravimetric measurements have been performed to study the morphological evolution of the compound. A progressive covering stage was demonstrated and revealed that a 40 nm thick film has already acquired morphological and optical behavior similar to that of thicker films. The optical thickness and electrochemical quartz crystal microbalance (EQCM) mass are coherent with a density of 7.06. Combined gravimetric and coulometric data confirm the formation of Bi2Te3 by determining the ratio m/z.
Keywords:Bismuth telluride   Electrodeposition   EQCM   In situ spectroscopic ellipsometry   Growth process
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