首页 | 本学科首页   官方微博 | 高级检索  
     


Daily planning and scheduling system for the EDS process in a semiconductor manufacturing facility
Authors:Young Hoon Lee  Myoungsoo Ham  Bruce Yoo  Jae Sun Lee
Affiliation:1. Department of Information and Industrial Engineering, Yonsei University, 134 Shinchon-Dong Seodaemoon-Gu, Seoul, 120-749, Korea
2. Samsung Electronics Ltd., Austin, TX, USA
Abstract:Operations management in a complex manufacturing environment is practiced hierarchically: production planning and scheduling in sequence since the integrated approach is not efficient and practical. Production targets and allocation to the equipment are determined in the planning procedure by considering the only the critical factors, and the detailed scheduling is determined with more information needed to accomplish the production targets provided in the planning step. There is always, therefore, a gap between the planning and scheduling procedure, and some control parameters or factors are used to control those gaps. In this paper an approach connecting two procedures is suggested, which can be applied in the EDS (electrical die sorting) or the probe process in the semiconductor manufacturing. The EDS process requires very flexible operation management since the manufacturing processing time is relatively short and the supply of upstream fabrication and the demand of downstream assembly have to be met simultaneously. Daily planning and scheduling procedure are modeled to minimize the tester change-over within the daily target. Because of the relatively long setup change-over time, daily planning and scheduling have to be performed so that the time needed for the device and probe card change is minimized as possible. Mathematical programming is suggested for the problem, and the modified model is developed which can be solved in a practical computational time on a daily base. The scheduling heuristic with the planning data obtained from the suggested model, is designed, and their performance is evaluated through the computational experiment.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号