Gruppo Sistemi e Circuiti, Istituto Elettrotecnico Nazionale Galileo Ferraris, I-10135, Torino, Italy
Abstract:
In the standard Markov technique applied to reliability analysis, components are characterized by two states: an up state and a down state. The present paper explores the possibility of studying system reliability, by modelling each component with a multi-state homogeneous Markov model (MHMM). It is shown that this approach is of value both in approximating non-exponential probability distributions and in helping to build up suitable models for physical processes. Examples are presented which illustrate how the multi-state technique fits many practical situations. Finally some open problems on this topic are suggested.