PLL soft functional failure analysis in advanced logic product using fault based analogue simulation and soft defect localization |
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| Authors: | Liming Gao Christian Burmer |
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| Affiliation: | 1. IMEC, Kapeldreef 75, Leuven B-3001, Belgium;2. University of Twente, Postbus 217, Enschede, 7500 AE, Netherlands;3. FB 2.047, NXP Semiconductors, Gerstweg 2, Nijmegen, 6534 AE, Netherlands;1. Department of Materials Science & Engineering, National Taiwan University, Taipei, Taiwan;2. IBM Research-Tokyo, Science & Technology, Kanagawa, Japan;1. Bayerisches Laserzentrum GmbH (blz), Konrad-Zuse-Str. 2-6, 91052 Erlangen, Germany;2. Institute of Photonic Technologies (LPT), Friedrich-Alexander-Universität Erlangen-Nürnberg, Konrad-Zuse-Str. 3-5, 91052 Erlangen, Germany;3. Erlangen Graduate School in Advanced Optical Technologies (SAOT), Friedrich-Alexander-Universität Erlangen-Nürnberg, Paul-Gordan-Str. 6, 91052 Erlangen, Germany;1. Harbin Institute of Technology, Shenzhen Graduate School, Shenzhen 518055, People''s Republic of China;2. State Key Laboratory of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, People''s Republic of China;1. Joining and Welding Research Institute, Osaka University, 11-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan;2. Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan |
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| Abstract: | Soft defect localization (SDL) is an analysis technique where changes in the pass/fail condition of a test are monitored while a laser is scanned across the device under test (DUT). This technique has proven its usefulness for quickly locating defects that are temperature, frequency, and/or voltage dependant, for example, scan logic soft fault. However, due to high sensibility at analogue circuits SDL meets great challenges. This work gives a new flow to analyze soft functional failure in advanced logic products using fault based analogue simulation and SDL. The paper will present one case study illustrating the application of analogue simulation based soft defect localization flow as an effective means to achieve fault isolation. |
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