Abstract: | The effect of the frequency and power of the bias applied to the substrate on plasma properties in 60 MHz (VHF) magnetron sputtering was investigated. The plasma properties in- clude the ion velocity distribution function (IVDF), electron energy probability function (EEPF), electron density n e , ion flux Γ i , and effective electron temperature T eff . These parameters were measured by a retarding field energy analyzer and a Langmuir probe in the 60 MHz magnetron sputtering, assisted with 13.56 MHz or 27.12 MHz substrate bias. The 13.56 MHz substrate bias led to broadening and multi-peaks IVDFs, Maxwellian EEPFs, as well as high electron density, ion flux, and low electron temperature. The 27.12 MHz substrate bias led to a further increase of electron density and ion flux, but made the IVDFs narrow. Therefore, the frequency of the substrate bias was a possible way to control the plasma properties in VHF magnetron sputtering. |