Design of experiments and statistical process control using wavelets analysis |
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| Affiliation: | 1. University of Bayreuth, Mathematical Institute, Germany;2. Ruhr-University Bochum, Institute of Automation and Computer Control, Germany;1. University “Politehnica” of Bucharest, Faculty of Aerospace Engineering, Str. Polizu, No. 1, 011063, Bucharest, Romania;2. Control Department, IMI Advanced Systems Div., P.O.B. 1044/77, Ramat Hasharon, 47100, Israel;1. German Aerospace Center (DLR), Oberpfaffenhofen, Germany;2. AIRBUS Flight Control Systems, Toulouse, France;3. DEIMOS-SPACE S.L.U., Madrid, Spain (now with the University of Bristol) |
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| Abstract: | In this paper, three new connections between Wavelets analysis and Statistical Quality Control are proposed. Firstly, we show that the Discrete Wavelet Transform, using Haar wavelet, is equivalent to the Xbar-R control scheme. Results concerning the distribution of wavelets coefficients, using others wavelets families, are presented, and then a new control chart, called DeWave, is proposed, in order to monitor the variability of the process. Secondly, the equivalence between the Likelihood Ratio and the Continuous Wavelet Transform, in terms of estimating the change time, is presented. Finally, we demonstrate that the Discrete Wavelet Transform is an equivalent representation of factorial Design Of Experiments. |
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| Keywords: | Fault detection Control charts Design of experiments Likelihood ratio Wavelets transformations Change time Multiscale SPC |
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