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扁平漆包线抖动干扰处理的研究
引用本文:宋章明,贺慧勇,黄跃俊.扁平漆包线抖动干扰处理的研究[J].计算机测量与控制,2020,28(11):150-154.
作者姓名:宋章明  贺慧勇  黄跃俊
作者单位:长沙理工大学物理与电子科学学院,长沙410114;近地空间电磁环境监测与建模湖南省普通高校重点实验室,长沙410114;长沙理工大学物理与电子科学学院,长沙410114;近地空间电磁环境监测与建模湖南省普通高校重点实验室,长沙410114;长沙理工大学物理与电子科学学院,长沙410114;近地空间电磁环境监测与建模湖南省普通高校重点实验室,长沙410114
基金项目:湖南省研究生科研创新项目(CX2018B574)
摘    要:在扁平漆包线表面缺陷在线检测过程中,样线抖动导致使用帧间差分法分离背景时产生抖动干扰。常见抖动干扰处理方法存在处理时间太长和误消除真实缺陷的问题,故提出了改进方法,首先分析了抖动干扰的分布区域,得到了抖动干扰与真实缺陷不处在同一行,且存在抖动干扰的行上前景像素点数量较多的性质。然后在分布区域内,将前景像素点数量超过一定阈值的行置零,实现对抖动干扰的消除。阈值的选取利用一种改进的Otsu处理分布图得到,该图是将图像所有行,按照行上前景像素点数量多少,统计行出现的频率。实验证明,与常见方法相比,改进方法处理时间短,不会误消除与抖动干扰连接的真实缺陷,得到的处理结果与理想结果的交并比达到88%以上,具有很好的应用前景。

关 键 词:扁平漆包线  缺陷检测  抖动干扰消除  改进的Otsu  交并比
收稿时间:2020/4/6 0:00:00
修稿时间:2020/4/26 0:00:00

Research On Titter Disturbance Processing Of Flat Enameled Wire
Abstract:During the on-line inspection of flat enameled wire surface defects, the jitter of the sample line caused jitter interference when the background was separated using the inter-frame difference method. Common jitter interference processing methods had the problems of too long processing time and false elimination of real defects, so an improved method was proposed. Firstly, the distribution area of the jitter interference was analyzed, and the property that the jitter interference is not on the same line as the real defect and the number of foreground pixels on the line where the jitter interference exists is large. Then, in the distribution area, the rows with the number of foreground pixels exceeding a certain threshold were set to zero to eliminate the jitter interference. The selection of the threshold was obtained by using an improved Otsu processing distribution map. The map was based on the number of foreground pixels on the line for all lines of the image, and the frequency of line appearance was counted. Experiments show that compared with common methods, the improved method with short processing time and does not mistakenly eliminate the real defects connected with jitter interference, and the IoU of the obtained processing results and the ideal results is more than 88%, which has a good application prospect.
Keywords:Flat enameled wire  Defect detection  Jitter interference elimination  improved Otsu  IoU
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