Plated-wire technology: A critical review |
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Authors: | Mathias J. Fedde G. |
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Affiliation: | Sperry Rand Corporation, Philadelphia, Pa.; |
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Abstract: | Electrodeposited cylindrical magnetic film memory technology is reviewed. Extensive references are made to previous work. New data is given in areas not previously reported. Special emphasis is given to the following items: 1) Applications: Plated-wire applications cover the spectrum from 100 to 1000 ns cycle time NDRO memories of 105to 107bits capacity in commercial and military markets. 2) Processing: Substrate preparation and electrochemical processing, as well as alternative magnetic plating solutions, and the control of pH, temperature, flow rate, Ni-Fe ratio, and other variables necessary for high yield plating are reviewed. 3) Aging: The conditions that stabilize the film and the test methods that predict a 10- to 100-year life are reviewed. 4) Testing: A practical approach to continuous production line testing is reviewed. 5) Bit Packing Density: Calculations on magnetization distribution along the wire are compared to experience. Although memory plane geometry is important, the wire characteristics dominate the achievable bit density. Wire diameter, film thickness Hk, and other factors are included in graphs useful for design purposes. 6) Memory Plane Construction: The relative advantages of several different forms are compared. The need for magnetic keepers and their advantages are reviewed. 7) Interactions: New data is presented on some of the effects of variations in word strap alignment and spacing as well as the sensitivity to variation in plated-wire spacing and bending. |
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