Dark current analysis and characterization ofInxGa1-xAs/InAsyP1-y gradedphotodiodes with x>0.53 for response to longer wavelengths(>1.7 μm) |
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Authors: | Linga KR Olsen GH Ban VS Joshi AN Kosonocky WF |
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Affiliation: | Epitaxx Inc., Princeton, NJ; |
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Abstract: | The dark current properties of InxGa1-xAs photodiodes, where x is varied from 0.53 to 0.82 for extending the long wavelength cutoff from 1.7 to 2.6 μm, are described. Detailed analyses of optoelectrical parameters of In0.82Ga 0.1As photodiodes are presented. Dark current, which is a critical parameter and limits the operation of the photodiode, is analyzed and compared with the experimental values. Typical characteristics of photodiodes with cutoff wavelengths of 1.7 μm (x=0.53), 2.2 μm (x=0.72), and 2.6 μm (x=0.82) are presented. The typical and best values of the dark currents obtained are presented |
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