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Structurally perfect silicon layers produced on sapphire by oxygen ion implantation
Authors:V. M. Vorotyntsev  E. L. Shobolov  V. A. Gerasimov
Affiliation:(1) School of Electronics, Electrical Engineering and Computer Science, The Queen’s University of Belfast, Belfast, BT9 5AH N, Ireland
Abstract:We demonstrate that the structural perfection of silicon layers on sapphire can be improved through high-temperature solid-state recrystallization after preamorphization of the most imperfect silicon layer near the silicon/sapphire interface by high-energy oxygen ions, followed by high-temperature recrystallization in an inert atmosphere.
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