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Development of secondary ion mass spectroscopy using medium energy C60 ion impact |
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| Authors: | K Hirata Y Saitoh M Adachi K Narumi |
| Affiliation: | a National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan b Takasaki Advanced Radiation Research Institute (TARRI), Japan Atomic Energy Agency (JAEA), Takasaki, Gumma 370-1292, Japan c Advanced Science Research Center, Japan Atomic Energy Agency (JAEA), Takasaki, Gumma 370-1292, Japan |
| Abstract: | In this paper, we report time-of-flight (TOF) secondary ion mass spectroscopy using primary C60 ions with an energy range from several tens of keV to several hundreds of keV. Application of the spectroscopy to the analysis of a poly(amino acid) film revealed that characteristic peaks, necessary for identification of the amino acid in proteins, show higher intensities for medium energy C60 (120 keV  and 540 keV  ) impacts than those for low energy C60 (30 keV  ) impacts. This finding demonstrates that medium energy C60 ion impacts are useful for highly sensitive characterization of amino acids. |
| Keywords: | 79 20 Rf 68 49 Sf |
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