Note: A scanning electron microscope sample holder for bidirectional characterization of atomic force microscope probe tips |
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| Authors: | Eisenstein Alon Goh M Cynthia |
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| Affiliation: | Department of Chemistry and Institute for Optical Sciences, University of Toronto, 80 St. George Street, Toronto M5S 3H6, Canada. |
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| Abstract: | A novel sample holder that enables atomic force microscopy (AFM) tips to be mounted inside a scanning electron microscopy (SEM) for the purpose of characterizing the AFM tips is described. The holder provides quick and easy handling of tips by using a spring clip to hold them in place. The holder can accommodate two tips simultaneously in two perpendicular orientations, allowing both top and side view imaging of the tips by the SEM. |
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