首页 | 本学科首页   官方微博 | 高级检索  
     


Background-free imaging of plasmonic structures with cross-polarized apertureless scanning near-field optical microscopy
Authors:Esslinger M  Dorfmüller J  Khunsin W  Vogelgesang R  Kern K
Affiliation:Max-Planck-Institut für Festk?rperforschung, 70569 Stuttgart, Germany. m.esslinger@fkf.mpg.de
Abstract:We present advances in experimental techniques of apertureless scanning near-field optical microscopy (aSNOM). The rational alignment procedure we outline is based upon a phase singularity that occurs while scanning polarizers around the nominal cross-polarized configuration of s-polarized excitation and p-polarized detection. We discuss the theoretical origin of this topological feature of the setup, which is robust against small deviations, such as minor tip misalignment or shape variations. Setting the polarizers to this singular configuration point eliminates all background signal, allowing for reproducible plasmonic eigenmode mapping with optimal signal-to-noise ratio.
Keywords:
本文献已被 PubMed 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号