An in-vacuum x-ray diffraction microscope for use in the 0.7-2.9 keV range |
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Authors: | Vine D J Williams G J Clark J N Putkunz C T Pfeifer M A Legnini D Roehrig C Wrobel E Huwald E van Riessen G Abbey B Beetz T Irwin J Feser M Hornberger B McNulty I Nugent K A Peele A G |
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Affiliation: | Australian Research Council Centre of Excellence for Coherent X-ray Science, Australia. dvine@aps.anl.gov |
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Abstract: | A dedicated in-vacuum coherent x-ray diffraction microscope was installed at the 2-ID-B beamline of the Advanced Photon Source for use with 0.7-2.9 keV x-rays. The instrument can accommodate three common implementations of diffractive imaging; plane wave illumination; defocused-probe (Fresnel diffractive imaging) and scanning (ptychography) using either a pinhole, focused or defocused probe. The microscope design includes active feedback to limit motion of the optics with respect to the sample. Upper bounds on the relative optics-to-sample displacement have been measured to be 5.8 nm(v) and 4.4 nm(h) rms/h using capacitance micrometry and 27 nm/h using x-ray point projection imaging. The stability of the measurement platform and in-vacuum operation allows for long exposure times, high signal-to-noise and large dynamic range two-dimensional intensity measurements to be acquired. Finally, we illustrate the microscope's stability with a recent experimental result. |
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