Electromagnetic analysis of axially symmetric diffractive lenses with the method of moments

We present the electromagnetic analysis of axially symmetric diffractive lenses. Analysis is performed by numerically solving the electric and magnetic field integral equations using the method of moments, and it exploits axial symmetry to reduce computational cost. Formulations for the analysis of loss less dielectric and perfectly conducting lenses are presented. The analysis of binary and eight-level lenses are performed to illustrate the utility of the technique.