A grounded coplanar waveguide technique for microwave measurement of complex permittivity and permeability |
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Authors: | Jiqing Hu Sligar A. Chih-Hung Chang Shih-Lien Lu Settaluri R.K. |
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Affiliation: | Microsoft Corp., Redmond, WA, USA; |
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Abstract: | We present a method for extracting the complex permittivity and permeability of dielectric/magnetic thin films in a grounded coplanar waveguide configuration. The technique is applicable for extraction of these material parameters for lossy and lossless materials over a broad frequency range with high accuracy. For validation, we extracted complex permittivity and permeability, using the scattering parameters obtained from the full-wave electromagnetic simulation for two test cases over a frequency range of 5 to 15 GHz. Accuracy for both dielectric as well as magnetic materials is within 2% error. |
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