| 宽带横电磁波小室设计与测试应用 |
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| 引用本文： | 袁钟柱,万发雨. 宽带横电磁波小室设计与测试应用[J]. 南京信息工程大学学报, 2021, 13(4): 437-443 |
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| 作者姓名： | 袁钟柱 万发雨 |
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| 作者单位： | 南京信息工程大学 电子与信息工程学院,南京,210044 |
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| 基金项目： | 国家自然科学基金（61971230） |
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| 摘 要： | 本文提出了一种符合IEC标准的横电磁波(TEM)小室,用于集成电路的电磁兼容测试.该TEM小室可在0～3 GHz内实现反射系数小于-12 dB,传输系数优于-2.5 dB.本文采用三维电磁仿真软件(Computer Simulation Technology,CST)对TEM小室的阻抗、S参数、场均匀性以及被测物(EU...
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| 关 键 词： | TEM小室 S参数 场均匀性 IC芯片 电磁兼容 |
| 收稿时间： | 2021-03-21 |
Design and test application of broadband TEM cell |
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| YUAN Zhongzhu and WAN Fayu. Design and test application of broadband TEM cell[J]. Journal of Nanjing University of Information Science & Technology, 2021, 13(4): 437-443 |
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| Authors: | YUAN Zhongzhu and WAN Fayu |
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| Affiliation: | School of Electronics & Information Engineering, Nanjing University of Information Science & Technology, Nanjing 210044 and School of Electronics & Information Engineering, Nanjing University of Information Science & Technology, Nanjing 210044 |
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| Abstract: | This paper proposes a Transverse Electric and Magnetic field (TEM) cell that meets the IEC standard to test the electromagnetic compatibility of Integrated Circuits (IC).The TEM cell is featured with less than -12 dB of reflection coefficient and better than -2.5 dB of transmission coefficient in frequency range of 0-3 GHz.The Computer Simulation Technology (CST) software is used to simulate the impedance, S-parameters, field uniformity and the influence of Equipment Under Test (EUT) on the field of the TEM cell, moreover, the TEM cell is fabricated and compared with commercial TEM cell.In addition, an electromagnetic compatibility test board is made according to the IEC standard, which is then used to measure the IC radiation emission with the TEM cell.The analysis of the measurement results indicates some aspects to improve the electromagnetic compatibility of the integrated circuits. |
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| Keywords: | TEM cell S parameter field uniformity IC chip electromagnetic compatibility |
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