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Steady-state electron transport in the III–V nitride semiconductors: A sensitivity analysis
Authors:Stephen K O’Leary  Brian E Foutz  Michael S Shur  Lester F Eastman
Affiliation:(1) Faculty of Engineering, University of Regina, S4S 0A2 Regina, Saskatchewan, Canada;(2) School of Electrical Engineering, Cornell University, 14853 Ithaca, NY;(3) Present address: Dept V32/256-2, Cadence Test Design Automation, 1701 North Street Endicott, 13760 NY;(4) Department of Electrical, Computer, and Systems Engineering, Rensselaer Polytechnic Institute, 12180-3590 Troy, NY
Abstract:We studied the sensitivity of the steady-state electron transport in GaN to variations in the important material parameters related to the band structure. We found (a) that an increase in the lowest conduction-band-valley effective mass leads to a lowering and broadening of the peak in the velocity-field characteristic, as well as to an increase in the field at which the peak occurs; (b) that increases in the upper conduction-band-valley effective masses dramatically decrease the saturation drift velocity, with very little other effect; (c) that increased nonparabolicity of the lowest conduction-band valley leads to a broadening and shifting to higher electric fields of the peak in the velocity-field characteristic; (d) that increases in the intervalley energy separation lead to moderate increases in the peak drift velocity; and (e) that increases in the degeneracy of the upper conduction-band valleys leads to a moderate decrease in the saturation drift velocity.
Keywords:Gallium nitride  III–  V nitride semiconductors  steady-state electron transport  peak drift velocity  saturation drift velocity  Monte Carlo simulations
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