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存储阵列中的串扰分析及脉冲产生电路设计
引用本文:龙娟,杨银堂,马城城.存储阵列中的串扰分析及脉冲产生电路设计[J].现代电子技术,2007,30(12):172-174.
作者姓名:龙娟  杨银堂  马城城
作者单位:西安电子科技大学,微电子学院,陕西,西安,710071
摘    要:在SRAM存储阵列的设计中,经常会遇到相邻信号线与电路节点间耦合引起的串扰问题。针对这个问题给出位线“间隔译码”的组织结构,有效地降低了存储器读写时寄生RC所带来的串扰。同时,针对该“间隔译码”的存储阵列结构,设计了脉冲产生电路,该电路只需要利用行地址的变化来生成充电脉冲,不仅简化了电路的规模,而且减小了读写操作时存储阵列中单元之间的串扰,提高了可靠性。

关 键 词:耦合  间隔译码  串扰
文章编号:1004-373X(2007)12-172-03
收稿时间:2006-10-27
修稿时间:2006-10-27

Analysis of Cross Talk in Memory Array and Design of Pulse Generator Circuit
LONG Juan,YANG Yintang,MA Chengcheng.Analysis of Cross Talk in Memory Array and Design of Pulse Generator Circuit[J].Modern Electronic Technique,2007,30(12):172-174.
Authors:LONG Juan  YANG Yintang  MA Chengcheng
Affiliation:Microelectronics Institute, Xidian University, Xi;an, 710071, China
Abstract:In the design of SRAM memory array,we often meet with the problem about cross talk which is brought about by adjacent signal wire and node coupling.In this paper,we discuss a new memory array-interval decoding architecture,which decreases cross talk parasitical RC aroused effectively during the period of read and writing operation.Simultaneously,we devise a pulse generator circuit,which produces charge-pulse by changing row address.The circuit not only simplifies the size,but also lower cross talk among memory array,which improves the reliability.
Keywords:SRAM
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