| 单片机自身的可靠性技术发展 |
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| 引用本文： | 陈卫兵. 单片机自身的可靠性技术发展[J]. 微电子技术, 2003, 31(4): 16-18 |
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| 作者姓名： | 陈卫兵 |
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| 作者单位： | 阜阳师范学院物理系,阜阳,236032 |
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| 摘 要： | 本文介绍单片机目前的发展趋势，以及在提供系统可靠性方面单片机自身的技术发展，以便于用户选用单片机来实现高可靠性的单片机应用系统。
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| 关 键 词： | 单片机 可靠性 时钟 |
| 文章编号： | 1008-0147(2003)04-16-03 |
| 修稿时间： | 2002-10-03 |
Development of Reliability Technique Single Chip Processor |
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| CHEN Wei-bing. Development of Reliability Technique Single Chip Processor[J]. Microelectronic Technology, 2003, 31(4): 16-18 |
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| Authors: | CHEN Wei-bing |
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| Abstract: | In this article, the current developing trend of single chip processor and the technical development of single chip processor itself in the way for offering reliability of system are introduced, so thar customer can select single chip processor and achieve applicable system of high reliability. |
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| Keywords: | Single chip processor Reliability Clock |
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