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Analysis of the Spectral Resolving Power in Tomographic Imaging Spectrometry
Authors:FANG Jun-yong  ZHAO Da-zun and JIANG Yue-juan
Affiliation:National Laboratory of Color Science and Engineering, Beijing Institute of Technology, Beijing 100081, China;National Laboratory of Color Science and Engineering, Beijing Institute of Technology, Beijing 100081, China;National Laboratory of Color Science and Engineering, Beijing Institute of Technology, Beijing 100081, China
Abstract:From the point of view of design requirements, influence of the width of the output image of an imaging subsystem in a tomographic imaging spectrometer, namely width of the slit, the grating and the size of the CCD pixel are analyzed. For the tomographic imaging spectrometry, if the amplification ratio of the imaging subsystem is not high enough to make the whole object to be compressed within the slit, then either the slit width should be increased or the slit width kept unchanged but scanned to receive information of the object. While the width-increase method reduces the spectral resolving power and the SNR; the scanning method reduces the SNR. Analysis of the two cases and computer simulation results are given.
Keywords:spectral resolving power  computed-tomography (CT)  imaging spectrometry  slit  CCD
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