晶体管、MOS器件 |
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摘 要: | Y2000-62027-37 0005671珠式凸点应力对缩比 MOS 场效应晶体管器件退化的影响=The influence of Stud bumping Stress on devicedegradation in scaled MOSFETs[会,英]/Shimoyama,N.& Machida,K.//1999 IEEE International Reliabili-ty Physics Symposium.—37~41(UC)
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