Alternative approach to dynamic I/V characterisation of microwave FETs |
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| Authors: | Limiti E Nanni A Serino A Giannini F |
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| Affiliation: | Dept. of Electron. Eng., Univ. di Roma Tor Vergata, Rome; |
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| Abstract: | A new and simple approach for the measurement of active device dynamic output I/V characteristics is presented. Device characterisation is performed making use of multi-harmonic exciting signal and variable loads at the output port. The measurement bench has been used to characterise a GaAs 1 mm gate periphery PHEMT as a test vehicle. The results, obtained making use of the proposed setup, successfully compare with those obtained via traditional pulsed measurement systems. |
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