Dynamic radiative properties of the Cu(In,Ga)Se2 layer during the co‐evaporation process

A study of the wavelength‐integrated emissivity has been performed on the optical stack Cu_xSe/Cu(In,Ga)Se₂/Mo. The wavelength interval used in the study was 2–20 µm, which covers 95% of the radiated heat from a black body heated to 500°C. Substrate temperatures around 500°C are commonly used in production of Cu(In,Ga)Se₂ thin films for solar cells. The integrated emissivity was obtained from directional reflectivity measurements of experimental samples with different thicknesses of the Cu_xSe layers. It was subsequently compared to the emissivity from numerical simulations based on newly obtained values of the refractive index values for Cu(In,Ga)Se₂ and Cu_xSe at these wavelengths. Good agreement was found between the measured and simulated values. At a Cu(In,Ga)Se₂ thickness of 1.8 µm and a Mo thickness of 400 nm, a maximum in the integrated emissivity was found for a Cu_xSe thickness of 30 nm. The results are valuable input into understanding the dynamics of the change in emissivity between Cu‐rich Cu(In,Ga)Se₂ with segregated Cu_xSe and Cu‐poor single phase Cu(In,Ga)Se₂ at temperatures around 500°C. In co‐evaporation of Cu(In,Ga)Se₂, this emissivity change is often monitored and used as a process control (end‐point detection). Copyright © 2010 John Wiley & Sons, Ltd.