LASER SPECTRAL ANALYSIS OF STRAIN MEASUREM ENT

Modern optical theory has shown that the far field or Fraunhofer diffraction equipment is identical to the Fourier spectral analyzer. In the Fourier spectral analyzer the Fourier spectra or the Fraunhofer diffraction pattern of a graph is formed on the back foeal plane when a laser beam is directed on the graph lying on the front focal plane； the Fourier spectra of the graph is also subjected to change during the deformation of the graph. Through analyzing the change of Fourier spectra the deformation of the graph can be obtained. A few years ago, based on the above principles the authors proposed a new technique of strain measurement by laser spectral analysis. Demonstration and discussion will be made in detail in this paper.