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Stacking-fault formation and propagation in 4H-SiC PiN diodes |
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| Authors: | R. E. Stahlbush M. Fatemi J. B. Fedison S. D. Arthur L. B. Rowland S. Wang |
| Affiliation: | (1) Naval Research Laboratory, 20375 Washington, D.C.;(2) General Electric Corporate Research and Development Center, 12309 Niskayun, NY;(3) Sterling Semiconductor, 06810 Danbury, CT |
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