Microstructure analysis of the Y5V multilayer ceramic capacitors based on BaTiO3 |
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Authors: | Yu-Chuan Wu Jheng-Syun Lee Hong-Yang Lu Ching-Li Hu |
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Affiliation: | (1) Centre for Nanoscience, Institute of Materials Science and Engineering, National Sun Yat-Sen University, Kaohsiung, 80424, Taiwan;(2) R&D Technology Centre, Yageo Corporation Nan-Tze Branch, Kaohsiung, 811, Taiwan |
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Abstract: | The Y5V-1206 base-metal electrode (BME) multilayer ceramic capacitor (MLCC) chips have been characterised for crystalline
phases using X-ray diffractometry (XRD), and microstructure using optical microscopy (OM), scanning electron microscopy (SEM)
and transmission electron microscopy (TEM). The microstructure features found in the Ni electrode and the BaTiO3 dielectric layer are discussed in terms of the tensile backstresses induced upon firing due to constrained sintering heterogeneously.
The chemical compositions containing BaO-excess and additives CaO and ZrO2, determined for BaTiO3 grains by energy-dispersive spectroscopy (EDS) equipped in the TEM are also reported. However, no rare-earth oxides were
found in the grains. The representative microstructure of BaTiO3 grains containing dislocations is the “solid-solution” type distinctive from the “core-shell” of the X7R compositions. The
fact that no ferroelectric domains were detected suggests that the BaTiO3 grains are pseudo-cubic with the c/a ratio ≈ 1.0. |
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Keywords: | BaTiO3 Dielectrics MLCCs TEM Sintering |
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