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基于非下采样Contourlet域高斯混合模型的布匹瑕疵识别算法
引用本文:崔玲玲,卢朝阳,李静,李益红.基于非下采样Contourlet域高斯混合模型的布匹瑕疵识别算法[J].吉林大学学报(工学版),2013,43(3):734-739.
作者姓名:崔玲玲  卢朝阳  李静  李益红
作者单位:西安电子科技大学综合业务网理论及关键技术国家重点实验室,西安,710071
基金项目:国家自然科学基金项目,中央高校基本科研业务费专项资金项目
摘    要:针对经典瑕疵检测算法不能很好地描述瑕疵特征和不易区分相似类瑕疵类别的问题,提出了一种非下采样Contourlet域高斯混合模型的布匹瑕疵识别算法。首先利用非下采样Cont-ourlet变换(NSCT)得到图像的多方向、多尺度和平移不变表示,并通过代价函数挑选一个最优子带;由于子带瑕疵和非瑕疵区域系数差别较小,很难直接选取阈值,采用标准差法可以有效避免这个问题,获得比较准确的检测结果;然后计算瑕疵区域的统计特征得到特征向量;接着引入最小误分率函数,联合估计样本的高斯混合模型参数;最后采用贝叶斯分类器进行分类。在9类瑕疵上的实验结果表明,本文算法与几种经典算法相比得到更高的分类正确率。

关 键 词:计算机应用  瑕疵分类  瑕疵检测  非下采样Contourlet变换  高斯混合模型

Fabric defect recognition algorithm based on Gaussian mixture model in nonsubsampled Contourlet domain
CUI Ling-ling,LU Zhao-yang,LI Jing,LI Yi-hong.Fabric defect recognition algorithm based on Gaussian mixture model in nonsubsampled Contourlet domain[J].Journal of Jilin University:Eng and Technol Ed,2013,43(3):734-739.
Authors:CUI Ling-ling  LU Zhao-yang  LI Jing  LI Yi-hong
Affiliation:(State Key Laboratory of Integrated Service Networks,Xidian University,Xi’an 710071,China)
Abstract:Classical detection algorithms can not describe the defect characteristics in a better way,and it is difficult to classify the defects of similar classes.To solve these problems,an algorithm based on Gaussian Mixture Model(GMM) in nonsubsampled Contourlet domain for fabric defect recognition is proposed.First,the Nonsubsampled Contourlet Transform(NSCT) is used to obtain the representations in multi-directions,multi-scales and translation invariants,and an optimal sub-band is selected by the cost function.The difference of coefficients between defect and non-defect regions of the sub-band is smaller;therefore,the threshold is difficult to choose.The standard deviation method can effectively avoid this problem to get accurate results.After that the feature vectors are calculated by the statistical characteristics of the defect region.Then,the minimum misclassification function is used for joint estimation of the GMM parameters.Finally,the classification is completed by Bayesian classifier.Experiments on defects of nine categories show that the proposed algorithm can achieve better classification accuracy compared with the traditional algorithms.
Keywords:computer application  defect classification  defect detection  nonsubsampled Contourlet transform(NSCT)  Gaussian mixture model(GMM)
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