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深亚微米飞高测量的光电检测系统设计
引用本文:王亮,李玉和,李庆祥,陈张玮.深亚微米飞高测量的光电检测系统设计[J].电测与仪表,2006,43(3):5-7,19.
作者姓名:王亮  李玉和  李庆祥  陈张玮
作者单位:清华大学,精密测试技术及仪器国家重点实验室,北京,100084;清华大学,精密测试技术及仪器国家重点实验室,北京,100084;清华大学,精密测试技术及仪器国家重点实验室,北京,100084;清华大学,精密测试技术及仪器国家重点实验室,北京,100084
摘    要:基于光电传感原理,设计了用于深亚微米飞高测量的光电检测系统,采用前置放大和后级放大电路结合,设计高速高精度数据采集系统,介绍了系统控制交互界面。性能测试结果表明,该光电检测系统线性度、分辨率和动态频率均满足飞高动态测试的要求。

关 键 词:高测量  近场光存储  光电检测  微弱信号
文章编号:1001-1390(2006)03-0005-03
收稿时间:2005-10-26
修稿时间:2005-10-26

Design of Optoelectronic Detection System for Deep Sub-micron Flying Height Measuring
WANG Liang,LI Yu-he,LI Qing-xiang,CHEN Zhang-wei.Design of Optoelectronic Detection System for Deep Sub-micron Flying Height Measuring[J].Electrical Measurement & Instrumentation,2006,43(3):5-7,19.
Authors:WANG Liang  LI Yu-he  LI Qing-xiang  CHEN Zhang-wei
Affiliation:State Key laboratory of Precision Measurement Technology and Instruments, University, Beijing 100084, China
Abstract:Based on the optoelectronic sense principle,a set of optoelectronic detection system for deep sub-micron flying height measuring is designed, which focuses on the preamplifier and post amplifier. It is a high-speed and high-precision data acquisition system, and the system control interactive interface is introduced. Analysis and experi- ment show that this system has proper parameters on linearity of optoelectronic detection system, measuring resolution and dynamic frequency, and can realize dynamic measuring for the deep sub-micron flying height.
Keywords:flying height measuring  near-field light storage  optoelectronic detection  feeble signal
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