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On GID-Testable Two-Dimensional Iterative Arrays
作者姓名:Huang WeiKang  F.Lombard
作者单位:[1]Dept.ofElectricalEngineering,FudanUniversity,Shanghai200433 [2]Dept.ofComputerScience,TexasA&MUniversity
摘    要:A new approach is presented for easily testable two-dimensional iterative arrays.It is an improvement of GI-testability (Group Identical testability)and is referred to as GID-testability (Group Identical and Different testability).In a GID-testable two-dimensional array,the primary x and y outputs are organized into groups and every group has more than one output.This is similar to the GI-testable arrays.However,GID-testability not only ensures that identical test responses can be obtained from every output in the same group when an array is fault free,but also ensures that at least one output has different test responses (from the other outputs in a group)when a cell in the array is faulty.Therefore,all faults can be detected under the assumption of a single faulty cell model.It is proved that an arbitrary two-dimensional iterative array is GID-testable if seven x-states and seven y-states are added to the original flow table of the basic cell of the array.GID-testability simplifies the response verification of built-in-self-testing in a way similar to PI-and GI-testability^6-9].Therefore,it is suitable for BIST design.

关 键 词:工程设计  工业生产  二维重复检测阵列

On GID-testable two-dimensional iterative arrays
Huang WeiKang,F.Lombard.On GID-Testable Two-Dimensional Iterative Arrays[J].Journal of Computer Science and Technology,1994,9(1):27-36.
Authors:Weikang Huang  F Lombard
Affiliation:Dept.of Electrical Engineering; Fudan Univereity; Shanghai 200433; Dept.of Computer Science; Texas A&M Universitg; College Station; Texas 77843-3112; USA;
Abstract:A new approach is presented for easily testable two-dimensional iterative arrays.It is an improvment on GI-testability (Group Identical testability) and is referred to as GID-testability (Group Identical and Different testability). In a GID-testable twodimensional array, the primary x and y outputs are organized into groups and every group has more than one output. This is similar to the GI-testable arrays. However,GID-testability not only ensures that identical test responses can be obtained from every output in the same group when an array is fault free, but also ensures that at least one output has different test responses (from the other outputs in a group) when a cell in the array is faulty Therefore, all faults can be detected under the assumption of a single faulty cell model. It is proved that an arbitrary two-dimensional iterative array is GID-testable if seven x-states and seven y-states are added to the original flow table of the basic cell of the array.GID-testability simplifies the response verification of built-in-self testing in a way similar to PL- and GI-testability6-9]. Therefore, it is suitable for BIST design.
Keywords:C-testability  design for testability  testing  fault detection  arrays  self-testing
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