| 降低半导体器件失效率的有效措施 |
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| 引用本文： | 金雷,金阳. 降低半导体器件失效率的有效措施[J]. 电子元件与材料, 2002, 21(3): 28-29,32 |
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| 作者姓名： | 金雷 金阳 |
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| 作者单位： | 1. 安徽省六安市0871总厂技术中心,安徽,六安,237010
2. 安徽省铜陵市三佳集团公司研究所,安徽,铜陵,244000 |
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| 摘 要： | 要提高电子产品的可靠性水平,必须加强对元器件的质量管理。本文系统地介绍了采用优选生产厂家、高温贮存、功率老化、质量信息反馈、改善检测手段等方法来降低半导体器件的失效率,提高整机的可靠性。实践证明,这些措施简单有效。
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| 关 键 词： | 半导体器件 失效率 有效措施 |
| 文章编号： | 1001-2028(2002)03-0028-02 |
Effective Measures to Reduce the Failure Rate of Semiconductor Devices |
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| JIN Lei,JIN Yang. Effective Measures to Reduce the Failure Rate of Semiconductor Devices[J]. Electronic Components & Materials, 2002, 21(3): 28-29,32 |
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| Authors: | JIN Lei JIN Yang |
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| Affiliation: | JIN Lei1,JIN Yang2 |
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| Abstract: | To improve the reliability of electronic products, a good quality control over components is a necessary. Introduced are some measure, including selecting manufacturer, performing electric ageing test and high temperature storage life test, improving test equipment, and adopting quality information feedback system with the aim of reducing the failure rate of semiconductor devices to improve the reliability of equipment. All the measures have been proved to be simple and effective. |
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| Keywords: | semiconductor devices failure rate effective measures |
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