Lateral constraints in plane strain compression of single crystals |
| |
Authors: | B. C. Wonsiewicz G. Y. Chin R. R. Hart |
| |
Affiliation: | 1. Bell Telephone Laboratories, Inc., Murray Hill, N.J.
|
| |
Abstract: | In plane strain compression tests where the walls of a channel suppress lateral flow, the lateral stress developed at the walls varies with the crystal orientation. We have applied a crystal plasticity analysis to calculate the ratio of lateral stress (σyy) to the compression stress (σxx) for fcc crystals compressed on the (110) plane and extended in various directions in (110). It was found that σyy/σxx is equal to zero from (110)[001] to ((110)[bar 112]) , at which point it rises discontinuously to a value of 1.5. It then decreases to a value of 1.0 for ((110)[bar 111]) and further to 0.5 for ((110)[bar 110]) . Tests on copper crystals generally confirmed the theoretical predictions. Deviations can be explained in a consistent way by recognizing the inability of the experimental apparatus to suppress small amounts of lateral flow. |
| |
Keywords: | |
本文献已被 SpringerLink 等数据库收录! |
|