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CuW触头着色探伤缺陷的研究
引用本文:吴文安,时代,韩会秋,李志鹏,肖春林.CuW触头着色探伤缺陷的研究[J].电工材料,2008(4).
作者姓名:吴文安  时代  韩会秋  李志鹏  肖春林
作者单位:辽宁金昌新材料有限公司,辽宁抚顺,113008
摘    要:重点研究了CuW触头产品着色探伤缺陷的种类、缺陷材料机械性能、缺陷材料断口形貌宏观分析,提出了CuW触头着色探伤缺陷的判定原则和方法。材料性能试验结果表明,着色探伤缺陷产品中具有CuW疏松、CuW-Cu界面裂纹、Cu端裂纹和Cu端疏松缺陷的材料其抗拉强度、硬度低于无缺陷材料,不符合CuW触头的技术要求;具有CuW-Cu界面气孔缺陷的材料其抗拉强度与无缺陷材料相当,符合CuW触头的技术要求。通过对CuW触头着色探伤缺陷断口组织形貌宏观分析,发现着色探伤缺陷部位是CuW触头的内部缺陷组织,材料缺陷具有一定的深度,在材料受力时预先开裂,产生了应力集中,减少了材料的受力面积,使CuW触头的机械性能降低,这是导致CuW触头着色探伤缺陷机械性能低的原因。

关 键 词:CuW合金  触头  着色探伤  探伤缺陷  粉末冶金

Detection of Defects in CuW Contactor by Dye Penetration
WU Wen-an,SHI Dai,HAN Hui-qiu,LI Zhi-Peng,XIAO Chun-lin.Detection of Defects in CuW Contactor by Dye Penetration[J].Electrical Engineering Materials,2008(4).
Authors:WU Wen-an  SHI Dai  HAN Hui-qiu  LI Zhi-Peng  XIAO Chun-lin
Abstract:Different kinds of defects in CuW contactor were detected by dye penetration method and a criterion was put forward to distinguish these defects in this paper.Most of defects,such as CuW porosity,CuW-Cu interface crack,crack and porosity in Cu part damaged the mechanical properties greatly,leading to lower tensile strength and lower hardness of CuW contactor,which was not qualified to the technical request.The reason for poor mechanical properties mentioned above might be rationalized that theses defects promote the formation of stress concentration and then develop crack when suffering load by analyzing the fracture morphology of these defects.However,some defects like pores at the CuW-Cu interface hade no negative effect on the mechanical properties of CuW contactor,which could be classified to qualified product.
Keywords:W-Cu alloy  contactor  dye penetration  detection of defects  powder metallurgy
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