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Study of modification methods of probes for critical-dimension atomic-force microscopy by the deposition of carbon nanotubes
Authors:O. A. Ageev  Al. V. Bykov  A. S. Kolomiitsev  B. G. Konoplev  M. V. Rubashkina  V. A. Smirnov  O. G. Tsukanova
Affiliation:1. Institute for Nanotechnologies, Electronics, and Electronic Equipment Engineering, Southern Federal University, Taganrog, Rostov-on-Don region, Russia
2. NT-MDT, Moscow, Russia
Abstract:
Keywords:
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