| 高性能薄膜偏振器的分析与测量 |
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| 引用本文： | 杨科晓.高性能薄膜偏振器的分析与测量[J].光电工程,1996,23(4):56-59. |
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| 作者姓名： | 杨科晓 |
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| 作者单位： | 浙江大学信息与电子工程学系 |
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| 摘 要： | 提出了一种简单有效的方法分析高性能堆积型薄膜偏振器，确定其等效介电常数及偏振特性，实际偏振器插入损耗和消光分贝的理论值分别为０．０１３ｄＢ和１１４ｄＢ，它们的测量值分别小于０．９ｄＢ和大于５２．８ｄＢ。
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| 关 键 词： | 起偏器 金属薄膜 介质膜 偏振特性 薄膜偏振器 |
Analysis and Measurement for High Property Thin Film Polarizer |
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| Yang Dongxiao.Analysis and Measurement for High Property Thin Film Polarizer[J].Opto-Electronic Engineering,1996,23(4):56-59. |
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| Authors: | Yang Dongxiao |
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| Abstract: | A simple and effective method for analyzing high property stacking type thin film polarizer is proposed in the paper.Its functions is to determine the dielectric constants and polarizing characteristics of the polarizer.The polarizer inserting loss and the extinction value in theory is 0.013 dB and 114 dB.respectively.Their practical measured values is less than 0.9 dB and larger than 52.8 dB,respectively. |
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| Keywords: | Polarizer Metal thin films Dielectric films Polarization characteristics |
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