基于加速性能退化试验的板级可靠性评估

传统的可靠性评估方法一般基于失效寿命数据,而目前对于高可靠长寿命的电子产品,很难通过加速试验获得其失效寿命时间。为解决这一矛盾,将性能退化理论引入到传统可靠性评估中,提出了基于失效数据及加速性能退化的可靠性评估的新方法。应用某型雷达24V/2A稳压电源板加速性能退化试验进行验证,结果表明该方法用于高可靠长寿命电子装备的可靠性评估是正确有效的。

PCB Reliability Assessment Based on Accelerated Performance Degradation Testing

The traditional reliability assessment methods are based on failure lifetime data.However,for high reliability and long lifetime products,it is very difficult to obtain their failure lifetime data through life test and accelerated life test.Degradation data can provide with useful information about the reliability assessment for these products.For these questions,a new good method is presented based on failure data's reliability assessment and accelerated performance degradation testing.Finally,this paper gives one case of accelerated performance degradation testing of 24V/2A power supply board of steady voltage to prove the method.And the results demonstrate that this method is correct and valid for reliability assessment of high reliability and long life electronic equipments.