Dielectric Properties of Yttrium Vanadate Crystals from 15 K to 295 K |
| |
Authors: | Mohan V Jacob Janina Mazierska Jerzy Krupka |
| |
Affiliation: | (1) Electrical and Computer Engineering, James Cook University, Townsville, QLD 4811, Australia;(2) Institute of Information Sciences and Technology, Massey University, New Zealand;(3) Instytut Mikroelektroniki I Optoelektroniki Politechniki Warszawskiej, Koszykowa 75, 00-662 Warszawa, Poland |
| |
Abstract: | Yttrium Vanadate (YVO4) is a birefringent crystal, which has similar dielectric constant as that of Sapphire. In this paper we have reported the
measurement of the real part of permittivity and loss tangent of YVO4 crystal in the temperature range 15–295 K at a frequency of 16.3 GHz. We have used the dielectric post resonator technique
for the microwave characterisation of the YVO4 dielectric rod. The multifrequency Transmission Mode Q-Factor (TMQF) technique has been used for data processing and hence
precise values of permittivity and loss tangent are achieved. Easily machineable YVO4 is characterized by low losses at microwave frequencies. At temperature of 15 K and frequency of 16.3 GHz the permittivity
was 9.23 and loss tangent was 2 × 10− 5. YVO4 is identified as a potential candidate to replace expensive Sapphire in many microwave applications. |
| |
Keywords: | Dielectric properties YVO4 |
本文献已被 SpringerLink 等数据库收录! |
|