Characterization of Chromia Scales Grown on Pure Chromium in Different Oxidizing Atmospheres

Abstract

Scanning electron microscopy, X-ray diffraction, photoelectrochemistry and microphotoelectrochemistry have been used to characterize thin chromia scales, in the micrometer range, grown on pure chromium at 900°C in oxygen and in water vapour. The duplex structure formed, more easily observable in water vapour grows by the opposite transport of chromium and of oxide/hydroxide ions. The external chromia subscale exhibits the usually reported 3.5 eV bandgap whereas the internal subscale presents a reduced gap possibly due to impurity contribution. Imaging the photocurrent generated in this subscale allows the observation of good metal-oxide interface properties of samples grown in H₂O, whereas samples grown in O₂, (liable to cracking during cooling), exhibit partially disrupted zones.