Static and dynamic test of high resolution DAC based on over sampling and low resolution ADC

The problem of the signal acquisition with high resolution and linearity for static and dynamic characterization of high resolution DACs is shifted into the problem of high speed signal acquisition at lower resolution. High speed low resolution ADC is used to over sample the signal sum of output voltage of the DAC under test and periodic reference voltage. Two different reference signals are used: sinusoidal for static test, and sawtooth for dynamic test. DAC output is reconstructed by means of the reference signal evaluated in the zero crossing sequence detected on the resulting signal.