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The Calculation of Matrix Effects in Measurements by the X-Ray Spectrum Microanalysis Method |
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| Authors: | A V Zablotskii A Yu Kuzin N N Mikheev M A Stepovich P A Todua E V Shirokova M N Filippov |
| Affiliation: | 1. Moscow Institute of Physics and Technology (MFTI), Dolgoprudnyi, Russia 2. Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV), Moscow, Russia 3. Research Center for Space Materials Science, Branch of the Shubnikov Institute of Crystallography, Russian Academy of Sciences, Kaluga, Russia 4. Tsiolkovskii Kaluga State University, Kaluga, Russia 5. Kurnakov Institute of General and Inorganic Chemistry, Russian Academy of Sciences (IONKh RAN), Moscow, Russia |
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